オノダ　ジョウ   小野田　穣    所属   福岡教育大学  教育学部 理科教育研究ユニット    職種   講師
言語種別	英語
発行・発表の年月	2021/03
形態種別	研究論文
査読	査読あり
標題	In-situ reproducible sharp tips for atomic force microscopy
執筆形態	共著
掲載誌名	Physical Review Applied
掲載区分	国外
出版社・発行元	American Physical Society
巻・号・頁	15,pp.034079
総ページ数	8
担当区分	筆頭著者,責任著者
国際共著	国際共著
著者・共著者	Jo Onoda, Tsuyoshi Hasegawa, Yoshiaki Sugimoto
概要	Atomically sharp tips are a requirement for scanning-probe microscopy, such as scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Compared with STM, AFM imaging is more sensitive to the sharpness of tip apices because long-range forces act as a background signal on the high-resolution AFM images originating from short-range forces. Here we report the investigation of in situ reproducible sharp tips for AFM. We make an Ag2S crystal, a mixed ionic and electronic conductor, on a conventional Si cantilever, and controllably grow and shrink the Ag nanoprotrusion by changing the polarity of the bias voltage between the tip and the sample. We are able to reduce the contribution of long-range forces by growing a Ag nanoprotrusion on the Ag2S tip, and obtain atomic-resolution AFM images. We also confirm that the Ag2S tip with a Ag nanoprotrusion, the end of which presumably terminates in Si atoms, is capable of simultaneous AFM and STM measurements.
DOI	10.1103/PhysRevApplied.15.034079