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オノダ ジョウ
小野田 穣 所属 福岡教育大学 教育学部 理科教育研究ユニット 職種 講師 |
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| 言語種別 | 英語 |
| 発行・発表の年月 | 2012/06 |
| 形態種別 | 研究論文 |
| 査読 | 査読あり |
| 標題 | Development of LEED apparatus using nano-tips fabricated by field-assisted etching |
| 執筆形態 | 共著 |
| 掲載誌名 | e-Journal of Surface Science and Nanotechnology |
| 掲載区分 | 国外 |
| 巻・号・頁 | 257,pp.8427-8432 |
| 総ページ数 | 6 |
| 担当区分 | 筆頭著者,責任著者 |
| 著者・共著者 | Jo Onoda, Tomomi Kanaoka, Megumi Kumon, Seigi Mizuno |
| 概要 | We have developed a low-energy electron diffraction (LEED) apparatus using field emission (FE) from scanning tunneling microscopy (STM) tips. Tips fabricated by field-assisted H2O etching enabled us to observe LEED patterns of few layer graphene grown on SiC(0001) reproducibly. The obtained hexagonal patterns showed a bias dependency and those obtained at sample biases of 93 V, 56 V, and 28 V were interpreted as patterns derived from the graphene, the SiC(0001) substrate, and a (6√3 × 6√3)R30° buffer layer, respectively. The analysis of Ewald sphere construction indicated that the opening angles of FE from the tip could be deduced directly from the LEED patterns, and their experimentally obtained value was ∼13°. From the opening angle of FE and the dataset of tip-to-sample distances, the irradiated areas were estimated at 350 nmφ when the sample bias was 100 V. |
| DOI | 10.1380/ejssnt.2012.292 |