オノダ　ジョウ   小野田　穣    所属   福岡教育大学  教育学部 理科教育研究ユニット    職種   講師
言語種別	英語
発行・発表の年月	2017/12
形態種別	研究論文
査読	査読あり
標題	High-resolution imaging of silicene on an Ag(111) surface by atomic force microscopy
執筆形態	共著
掲載誌名	Physical Review B
掲載区分	国外
出版社・発行元	American Physical Societ
巻・号・頁	96,pp.241302(R)
総ページ数	5
担当区分	筆頭著者,責任著者
著者・共著者	Jo Onoda, Keisuke Yabuoshi, Hiroki Miyazaki, Yoshiaki Sugimoto
概要	Silicene, a two-dimensional (2D) honeycomb arrangement of Si atoms, is expected to have better electronic properties than graphene and has been mostly synthesized on Ag surfaces. Although scanning tunneling microscopy (STM) has been used for visualizing its atomic structure in real space, the interpretation of STM contrast is not straightforward and only the topmost Si atoms were observed on the (4 × 4) silicene/Ag(111) surface. Here, we demonstrate that high-resolution atomic force microscopy (AFM) can resolve all constituent Si atoms in the buckled honeycomb arrangement of the (4 × 4) silicene. Site-specific force spectroscopy attributes the origin of the high-resolution AFM images to chemical bonds between the AFM probe apex and the individual Si atoms on the (4 × 4) silicene.
DOI	10.1103/PhysRevB.96.241302