オノダ　ジョウ   小野田　穣    所属   福岡教育大学  教育学部 理科教育研究ユニット    職種   講師
言語種別	英語
発行・発表の年月	2018/11
形態種別	研究論文
査読	査読あり
標題	Structural identification of silicene on the Ag(111) surface by atomic force microscopy
執筆形態	共著
掲載誌名	Physical Review B
掲載区分	国外
出版社・発行元	American Physical Society
巻・号・頁	98,pp.195311
総ページ数	10
担当区分	筆頭著者
国際共著	国際共著
著者・共著者	Lingyu Feng*, Keisuke Yabuoshi, Yoshiaki Sugimoto, Jo Onoda*, Masahiro Fukuda, Taisuke Ozaki *L.F. and J.O. contributed equally to this work.
概要	The diversity of those arrangements, which expands its potential applications, makes it difficult to determine its structure in any particular case. In this paper, we show that atomic force microscopy (AFM) has the capability of structural determination of unknown phases of silicene. We carried out an AFM observation of ( √13 × √13)R13.9◦ silicene of unknown structures on Ag(111). Remarkably, it was shown that all constituent Si atoms forming a honeycomb lattice can be resolved by AFM whereas scanning tunneling microscopy (STM) can image only the topmost Si atoms. High-resolution AFM imaging allowed us to identify two types of buckled structure of (√13 × √13)R13.9◦ silicene on Ag(111), which had not been previously discriminated. The structure models obtained by theoretical simulation reproduced AFM images as well as previous STM images.
DOI	10.1103/PhysRevB.98.195311