オノダ　ジョウ   小野田　穣    所属   福岡教育大学  教育学部 理科教育研究ユニット    職種   講師
言語種別	英語
発行・発表の年月	2019/10
形態種別	研究論文
標題	Force spectroscopy using a quartz length-extension resonator
執筆形態	共著
掲載誌名	Applied Physics Letters
掲載区分	国外
出版社・発行元	American Institute of Physics
巻・号・頁	115,pp.173104
総ページ数	5
国際共著	国際共著
著者・共著者	Yoshiaki Sugimoto, Jo Onoda
概要	Frequency modulation atomic force microscopy detects the interaction force between the tip and the sample by measuring the change in the resonance frequency of an oscillating force sensor. Short-range interaction force can be selectively detected by a small oscillation amplitude. A quartz length-extension resonator (LER) offers the advantage of small-amplitude operation by virtue of its ultrahigh stiffness. Here, we demonstrate that an LER can accurately measure the short-range interaction force at cryogenic temperature even under a high magnetic field. We derive a formula for calculating the effective stiffness of an oscillating LER by using the theory of elasticity. The obtained dynamic stiffness is 1.23 times greater than the static stiffness, and this difference significantly affects the estimation of the interaction force. Using a properly calibrated LER, force curves are measured on Si(111)-(7×7) surfaces.
DOI	10.1063/1.5112062