オノダ　ジョウ   小野田　穣    所属   福岡教育大学  教育学部 理科教育研究ユニット    職種   准教授
言語種別	英語
発行・発表の年月	2019/10
形態種別	研究論文
査読	査読あり
標題	Less-ordered structures of silicene on Ag(111) surface revealed by atomic force microscopy
執筆形態	共著
掲載誌名	Physical Review Materials
掲載区分	国外
出版社・発行元	American Physical Societ
巻・号・頁	3,pp.104002
総ページ数	6
担当区分	筆頭著者,責任著者
国際共著	国際共著
著者・共著者	Jo Onoda, Lingyu Feng, Keisuke Yabuoshi and Yoshiaki Sugimoto
概要	Silicene, a silicon analog of graphene, has the potential to become a candidate next-generation material by virtue of its novel physical and chemical properties. Although a rich variety of rotationally nonequivalent silicene structures have been observed with silicene grown on Ag(111) surfaces, the T phase, which has been considered a precursor phase, has a less-ordered structure, and thus, it is difficult to clarify its atomic structure. In this paper, we report the atomic structures of the T phase observed by high-resolution atomic force microscopy (AFM). While scanning tunneling microscopy images of the T phase show characteristic round dots, AFM reveals that the T phase has a continuous Si honeycomb arrangement, thus forming silicene. We identify two types of T phases with different silicene rotation angles with respect to the Ag substrate: the (√13 × √13) type-I T phase and the tiling-pattern T phase.
DOI	10.1103/PhysRevMaterials.3.104002