オノダ ジョウ
小野田 穣 所属 福岡教育大学 教育学部 理科教育研究ユニット 職種 講師 |
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言語種別 | 英語 |
発行・発表の年月 | 2019/10 |
形態種別 | 研究論文 |
査読 | 査読あり |
標題 | Less-ordered structures of silicene on Ag(111) surface revealed by atomic force microscopy |
執筆形態 | 共著 |
掲載誌名 | Physical Review Materials |
掲載区分 | 国外 |
出版社・発行元 | American Physical Societ |
巻・号・頁 | 3,pp.104002 |
総ページ数 | 6 |
担当区分 | 筆頭著者,責任著者 |
国際共著 | 国際共著 |
著者・共著者 | Jo Onoda, Lingyu Feng, Keisuke Yabuoshi and Yoshiaki Sugimoto |
概要 | Silicene, a silicon analog of graphene, has the potential to become a candidate next-generation material by
virtue of its novel physical and chemical properties. Although a rich variety of rotationally nonequivalent silicene structures have been observed with silicene grown on Ag(111) surfaces, the T phase, which has been considered a precursor phase, has a less-ordered structure, and thus, it is difficult to clarify its atomic structure. In this paper, we report the atomic structures of the T phase observed by high-resolution atomic force microscopy (AFM). While scanning tunneling microscopy images of the T phase show characteristic round dots, AFM reveals that the T phase has a continuous Si honeycomb arrangement, thus forming silicene. We identify two types of T phases with different silicene rotation angles with respect to the Ag substrate: the (√13 × √13) type-I T phase and the tiling-pattern T phase. |
DOI | 10.1103/PhysRevMaterials.3.104002 |