オノダ　ジョウ   小野田　穣    所属   福岡教育大学  教育学部 理科教育研究ユニット    職種   講師
言語種別	英語
発行・発表の年月	2020/02
形態種別	研究論文
査読	査読あり
標題	Chemical identification of the foremost tip atom in atomic force microscopy
執筆形態	共著
掲載誌名	Nano Letters
掲載区分	国外
出版社・発行元	American Chemical Society
巻・号・頁	20,pp.2000-2004
総ページ数	5
担当区分	筆頭著者,責任著者
国際共著	国際共著
著者・共著者	Jo Onoda, Hiroki Miyazaki, Yoshiaki Sugimoto
概要	Chemical identification of individual surface atoms has been achieved by measuring the chemical bonds between tip and surface atoms using atomic force microscopy. On the other hand, the discrimination of chemical species at the tip apex is still a challenging task, even though the differences of the species have significant effects on atomic-scale contrast and atom manipulation. Here, we perform the chemical identification of a foremost tip atom using bond energies measured on precharacterized atomic species on a Si surface. We find that chemically different tips show different trends in the chemical bond energy on the sites and that Pauling’s equation for polar covalent bonds well describes those trends. On the basis of this knowledge, in situ chemical identification becomes possible. Using the chemically identified (here, Si and Al) tips, we determine the electronegativity of locally formed silicon oxide solely by experiments.
DOI	10.1021/acs.nanolett.9b05280